Recent years have seen the development of new quantitative techniques in transmission electron microscopy for the measurement of local properties, chemistry and structure in materials science. Examples include elemental mapping, strain mapping, and measurement of electric and magnetic fields at the nanoscale. Not only can numbers be obtained but soon 3-dimensional data sets will be available via electron tomography. In parallel, microscopes are becoming increasingly sophisticated (Cs correctors, imaging filters, in-situ stages, detectors…) allowing new possibilities and increased accuracy for existing techniques.

Objectives of this second QEM workshop are to enable attendants to apply and develop such quantitative techniques in their own laboratories and/or in collaboration with specialist centres for TEM. Ultimately, it hopes to encourage the emergence of an informal network of microscopists across Europe versed in these new techniques.

Prerequisites: as the school concerns advanced techniques, attendants should already be experienced in electron microscopy. A materials science background is assumed.

• Registration for QEM 2009 is now closed.
  Final admittance and complementary lists are in process of being drawn up. Candidates will be contacted by email by the end of January to confirm their admittance and to detail how to register.